An improved Integrated Coherent Receiver optical-electronic testing system

被引：0
|
作者：
Lei Xun [1 ,2 ]
Peng Jiaxin [2 ]
Liu Bolan [2 ]
Zhu Shichao [2 ]
Yu Sheng [2 ]
Lululuzi [2 ]
Cao Quan [2 ]
Jiang Hao [3 ]
机构：
[1] Wuhan Fiberhome Tech Serv Co Ltd, 11th Floor,Bldg 1,6,Gaoxin 4th Rd, Wuhan 430205, Hubei, Peoples R China
[2] Wuhan Fisilink Microelect Technol Co Ltd, 2nd Floor,Opt Commun Ind Bldg,Guandong Ind Pk, Wuhan 430073, Hubei, Peoples R China
[3] Wuhan Univ, Elect Informat Sch, Wuhan 430072, Hubei, Peoples R China
来源：
AOPC 2022: OPTOELECTRONICS AND NANOPHOTONICS | 2022年 / 12556卷
关键词：
Chip level; Device level; Integrated Coherent Receiver; phase error; S parameter; Mass production test;
D O I：
10.1117/12.2652043
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We present an improved 400G chip/device level Integrated Coherent Receiver (ICR) optical-electronic testing system based on the system last year [1]. It shows high repeatability and high accuracy compared with commercial system. This new system can greatly promote the efficiency, and it is also compatible for 100G/400G chip level test and device level test. What's more, the system can get most of important parameters of ICR automatically.
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页数：4
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