Tunnel junction with the thin-film electrodes in a resistive phase-slip state

被引：0
|
作者：
Kulikovsky, AV
Erganokov, KK
机构：
[1] General Physics Institute of RAS, 117942 Moscow
来源：
CZECHOSLOVAK JOURNAL OF PHYSICS | 1996年 / 46卷
关键词：
D O I：
10.1007/BF02583640
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Resistive current state of wide superconducting tin films with the phase-slip lines has been studied experimentally. We measured the current-voltage characteristics (CVCs) of the junction with the electrodes-nide films in the resistive phase-slip state. Features related to the formation and evolution of the phase-slip lines in wide films have been discovered on the CVCs of the tunnel junction.
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页码：665 / 666
页数：2
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