Characterization of a burn-in failure caused by a defective source driver on TFT-LCD panel

被引：0

作者：

Wang, Fred S. C. ^{[1
]}

Lin, Keh-La ^{[1
]}

Tso, Ko-Yang ^{[1
]}

Chao, Chin-Chieh ^{[1
]}

Wang, Wai William ^{[1
]}

Yu, Alan ^{[1
]}

Lee, C. Y. ^{[1
]}

Kuo, Chien Hung ^{[1
]}

Wang, C. W. Arex ^{[2
]}

Chiu, Yi ^{[3
]}

机构：

[1] Raydium Semicond Corp, 2nd Floor 1,Sec 2,Li Hsin Rd,Hsin Chu Sci Pk, Hsinchu 300, Taiwan

[2] AU Optron Corp, Adv Technol Ctr, Hsinchu 300, Taiwan

[3] Natl Chiao Tung Univ, Dept Elect & Control Engn, Hsinchu 300, Taiwan

来源：

IPFA 2006: PROCEEDINGS OF THE 13TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS | 2006年

关键词：

bit-line defect; CP; COG; TFT-LCD; LCD driver; source driver; DVS; EMMI; EDAX; two-step DAC; ATE;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper describes a thorough investigation to identify the root cause of an LCD panel bum-in failure induced by an LCD source driver, which is observed in a large-scale LCD factory producing more than one million LCD panels per month. The investigation demonstrates the effectiveness of the circuit simulation to precisely locate the defective spot which is caused by a metal slice originated from outer rings of an LCD COG (chip-on-glass) source driver. With the aid of emission microscope (EMMI), Energy Dispersive Analysis X-Ray (EDAX), and Chip Probing (CP) tester, the root cause of the failure is well explained. The formation mechanism of metal slice from the outer rings is thoroughly studied. A solution to completely eliminate the source of metal slices from the outer rings during wafer processing is also proposed.

引用

页码：171 / +

页数：2

共 50 条

[1] A Novel Charge Recycler for TFT-LCD Source Driver IC
Li, Dan
Wei, Tingcun
Wu, Wei
GLSVLSI'07: PROCEEDINGS OF THE 2007 ACM GREAT LAKES SYMPOSIUM ON VLSI, 2007, : 156 - 159
[2] TFT-LCD panel life study
Chu, Tao-Peng
Sheu, Shey-Huei
Wang, Fu-Kwun
Journal of Quality, 2010, 17 (05): : 403 - 419
[3] TFT-LCD panel driver IC using dynamic function shuffling technique
Shima, T
Itakura, T
Minamizaki, H
Yagi, T
Maruyama, T
1997 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE - DIGEST OF TECHNICAL PAPERS, 1997, 40 : 192 - 193
[4] TFT-LCD drive method and driver LSI
Hitachi Rev, 4 (177):
[5] EMI analysis of TFT-LCD Driver IC
Choi, Sung-Pil
Kwon, Jae Wook
Chang, Kye Eon
Kim, Jin Tae
Han, Min Koo
2006 17TH INTERNATIONAL ZURICH SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, VOLS 1 AND 2, 2006, : 606 - +
[6] A BIST Architecture for Multiple DACs in an LTPS TFT-LCD Source Driver IC
Son, Hyeonuk
Jang, Jaewon
Kim, Youbean
Kim, Kicheol
Kim, Incheol
Kang, Sungho
2009 INTERNATIONAL SOC DESIGN CONFERENCE (ISOCC 2009), 2009, : 120 - 123
[7] A TFT-LCD source-driver IC with charge-recycling technique
Lu, Chih-Wen
Hsu, Kuo-Jen
ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2011, 66 (01) : 19 - 29
[8] A TFT-LCD source-driver IC with charge-recycling technique
Chih-Wen Lu
Kuo-Jen Hsu
Analog Integrated Circuits and Signal Processing, 2011, 66 : 19 - 29
[9] FINE-PITCH COG DRIVER FOR TFT-LCD
WATANABE, T
TOUICHI, T
TANAKA, S
SANO, Y
SHARP TECHNICAL JOURNAL, 1993, (56): : 81 - 82
[10] Full-color analog TFT-LCD driver
Sakaguchi, Y
Kobayashi, Y
ELECTRONICS AND COMMUNICATIONS IN JAPAN PART II-ELECTRONICS, 1998, 81 (06): : 43 - 51

← 1 2 3 4 5 →