Active inductor shunt peaking in high-speed VCSEL driver design

被引:7
|
作者
Liang Fu-Tian [1 ,2 ]
Gong Datao [2 ]
Hou Suen [3 ]
Liu Chonghan [2 ]
Liu Tiankuan [2 ]
Su Da-Shung [3 ]
Teng Ping-Kun [3 ]
Xiang Annie [2 ]
Ye Jingbo [2 ]
Jin Ge [1 ]
机构
[1] Univ Sci & Technol China, State Key Lab Particle Detect & Elect, Hefei 230026, Anhui, Peoples R China
[2] So Methodist Univ, Dallas, TX 75275 USA
[3] Acad Sinica, Inst Phys, Taipei 11529, Taiwan
基金
中国国家自然科学基金;
关键词
active inductor; shunt peaking; high-speed VCSEL driver; ASIC;
D O I
10.1088/1674-1137/37/11/116101
中图分类号
O57 [原子核物理学、高能物理学];
学科分类号
070202 ;
摘要
An all-transistor active-inductor shunt-peaking structure has been used in a prototype of 8 Gbps high-speed VCSEL driver which is designed for the optical link in ATLAS liquid Argon calorimeter upgrade. The VCSEL driver is fabricated in a commercial 0.25 mu m Silicon-on-Sapphire (SoS) CMOS process for radiation tolerant purpose. The all-transistor active-inductor shunt-peaking is used to overcome the bandwidth limitation from the CMOS process. The peaking structure has the same peaking effect as the passive one, but takes a small area, does not need linear resistors and can overcome the process variation by adjust the peaking strength via an external control. The design has been taped out, and the prototype has been proven by the preliminary electrical test results and bit error ratio test results. The driver achieves 8 Gbps data rate as simulated with the peaking. We present the all-transistor active-inductor shunt-peaking structure, simulation and test results in this paper.
引用
收藏
页数:4
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