A low-cost strategy for managing tools and processes through modeling basic parameters and applying input SPC to both basic parameters and to relationships among basic parameters

被引:0
|
作者
English, S [1 ]
Morgan, JW [1 ]
机构
[1] STMicroelect, Phoenix, AZ USA
来源
2004 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE AND WORKSHOP: ADVANCING THE SCIENCE AND TECHNOLOGY OF SEMICONDUCTOR MANUFACTURING EXCELLENCE | 2004年
关键词
vital signs; model-based tool management (MBTM); model-based process control (MBPQ; input statistical process control (iSPQ; SECS; automation; e-diagnostics; yield; defect density; cycle time; cost; time-to-volume; measurement; virtual sensor; predictive maintenance; metrology;
D O I
10.1109/ASMC.2004.1309564
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:193 / 198
页数:6
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