Combining nanocalorimetry and dynamic transmission electron microscopy for in situ characterization of materials processes under rapid heating and cooling

被引:28
|
作者
Grapes, Michael D. [1 ,2 ]
LaGrange, Thomas [3 ]
Friedman, Lawrence H. [2 ]
Reed, Bryan W. [3 ]
Campbell, Geoffrey H. [3 ]
Weihs, Timothy P. [1 ]
LaVan, David A. [2 ]
机构
[1] Johns Hopkins Univ, Dept Mat Sci & Engn, Baltimore, MD 21218 USA
[2] NIST, Mat Measurement Sci Div, Mat Measurement Lab, Gaithersburg, MD 20899 USA
[3] Lawrence Livermore Natl Lab, Condensed Matter & Mat Div, Livermore, CA 94550 USA
来源
REVIEW OF SCIENTIFIC INSTRUMENTS | 2014年 / 85卷 / 08期
基金
美国国家科学基金会;
关键词
THIN-FILMS; ULTRATHIN FILMS; ALLOY; PURE; DTEM;
D O I
10.1063/1.4892537
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Nanocalorimetry is a chip-based thermal analysis technique capable of analyzing endothermic and exothermic reactions at very high heating and cooling rates. Here, we couple a nanocalorimeter with an extremely fast in situ microstructural characterization tool to identify the physical origin of rapid enthalpic signals. More specifically, we describe the development of a system to enable in situ nanocalorimetry experiments in the dynamic transmission electron microscope (DTEM), a time-resolved TEM capable of generating images and electron diffraction patterns with exposure times of 30 ns-500 ns. The full experimental system consists of a modified nanocalorimeter sensor, a custom-built in situ nanocalorimetry holder, a data acquisition system, and the DTEM itself, and is capable of thermodynamic and microstructural characterization of reactions over a range of heating rates (102 K/s-105 K/s) accessible by conventional (DC) nanocalorimetry. To establish its ability to capture synchronized calorimetric and microstructural data during rapid transformations, this work describes measurements on the melting of an aluminum thin film. We were able to identify the phase transformation in both the nanocalorimetry traces and in electron diffraction patterns taken by the DTEM. Potential applications for the newly developed system are described and future system improvements are discussed. (C) 2014 AIP Publishing LLC.
引用
收藏
页数:12
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