Sextuple Cross-Coupled-DICE Based Double-Node-Upset Recoverable and Low-Delay Flip-Flop for Aerospace Applications

被引:0
|
作者
Yan, Aibin [1 ]
Chen, Yu [1 ]
Song, Shukai [1 ]
Zhai, Zijie [1 ]
Cui, Jie [1 ]
Huang, Zhengfeng [2 ]
Girard, Patrick [3 ]
Wen, Xiaoqing [4 ]
机构
[1] Anhui Univ, Sch Comp Sci & Technol, Hefei, Peoples R China
[2] Hefei Univ Technol, Sch Microelect, Hefei, Peoples R China
[3] Univ Montpellier, CNRS, Lab Informat Robot & Microelect Montpellier, Montpellier, France
[4] Kyushu Inst Technol, Grad Sch Comp Sci & Syst Engn, Fukuoka, Japan
基金
中国国家自然科学基金;
关键词
Harsh radiation; flip-flop reliability; soft error; recovery; DESIGN;
D O I
10.1145/3526241.3530355
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
This paper proposes a novel sextuple cross-coupled dual-interlocked-storage-cell (DICE) based double-node-upset (DNU) recoverable and low-delay flip-flop (FF), namely SCDRL-FF, for aerospace applications. The SCDRL-FF mainly consists of sextuple cross-coupled DICEs controlled by clock-gating. The use of clock-gating based DICEs significantly reduces the CLK-Q transmission delay of the SCDRL-FF. Through the redundant and interlocked clock-gating based DICEs, the SCDRL-FF can provide complete DNU recoverability. Simulation results demonstrate the DNU recoverability of the SCDRL-FF and a 65% delay reduction on average compared with the state-of-the-art hardened FFs. The low delay overhead makes the proposed SCDRL-FF effectively applicable to high-performance applications and the DNU recoverability makes the proposed SCDRL-FF also suitable for aerospace applications.
引用
收藏
页码:333 / 338
页数:6
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