Beam Conditioning in Cutting Edge X-ray Analytical Equipment.

被引：0
|
作者：
Graf, Juergen [1 ]
Kleine, Andreas [1 ]
Wiesmann, Joerg [1 ]
Michaelsen, Carsten [1 ]
机构：
[1] Incoatec GmbH, Geesthacht, Germany
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2013年 / 69卷
关键词：
X-ray optics; multilayer thin films; new XRD technology;
D O I：
10.1107/S0108767313095834
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS21-P01
引用
收藏
页码：S482 / S482
页数：1
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