Evaluation of deep etching techniques for silicon micromachined pressure sensor

被引:0
|
作者
Sooriakumar, K
Chan, WK
机构
来源
PROCEEDINGS OF THE THIRD INTERNATIONAL SYMPOSIUM ON MICROSTRUCTURES AND MICROFABRICATED SYSTEMS | 1997年 / 97卷 / 05期
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中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
Sensor fabrication often requires deep etching of silicon to form a thin diaphragm or cantilever beams. For pressure sensors, deep cavities are etched in the back of silicon wafers to make thin diaphragms. Although several tools and techniques are available for etching silicon, many of these tools and techniques fall short of fulfilling the need for process reliability and high throughput. This paper will discuss various etch methods and their intended purposes.
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页码:131 / 143
页数:13
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