Continuity equation based nonquasi-static charge model for independent double gate MOSFET

被引:2
|
作者
Sharan, Neha [1 ]
Mahapatra, Santanu [1 ]
机构
[1] Indian Inst Sci, Dept Elect Syst Engn, Nano Scale Device Res Lab, Bangalore 560012, Karnataka, India
关键词
Compact modeling; Nonquasi static (NQS) effect; Double gate (DG) MOSFET; SIGNAL SIMULATIONS; LINEARIZATION; DESIGN;
D O I
10.1007/s10825-013-0540-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Using the numerical device simulation we show that the relationship between the surface potentials along the channel in any double gate (DG) MOSFET remains invariant in QS (quasistatic) and NQS (nonquasi-static) condition for the same terminal voltages. This concept along with the recently proposed 'piecewise charge linearization' technique is then used to develop the intrinsic NQS charge model for a Independent DG (IDG) MOSFET by solving the governing continuity equation. It is also demonstrated that unlike the usual MOSFET transcapacitances, the inter-gate transcapacitance of a IDG-MOSFET initially increases with the frequency and then saturates, which might find novel analog circuit application. The proposed NQS model shows good agreement with numerical device simulations and appears to be useful for efficient circuit simulation.
引用
收藏
页码:353 / 359
页数:7
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