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- [1] Acoustic Metrology for Fine Pitch Microbumps in 3DIC 2019 30TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC), 2019,
- [3] Innovative approaches for 3D metrology and defect analysis on advanced packaging structures 2024 35TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE, ASMC, 2024,
- [4] 3D X-Ray Microscopy: A Non Destructive High Resolution Imaging Technology That Replaces Physical Cross-Sectioning For 3DIC Packaging 2013 24TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC), 2013, : 249 - 255
- [5] Advanced Chip to Wafer Bonding: A Flip Chip to Wafer Bonding Technology for High Volume 3DIC Production Providing Lowest Cost of Ownership 2009 INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY & HIGH DENSITY PACKAGING (ICEPT-HDP 2009), 2009, : 852 - +
- [6] Pre- and Post-Thinning Silicon Thickness Mapping using a High Throughput Defect Inspection System for Advanced 3D IC Packaging PROCEEDINGS OF THE 2012 IEEE 14TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2012, : 614 - 618
- [7] ADVANCED RF PACKAGING TECHNOLOGY TRENDS, FROM WLP AND 3D INTEGRATION TO 5G AND MMWAVE APPLICATIONS 2019 INTERNATIONAL WAFER LEVEL PACKAGING CONFERENCE (IWLPC), 2019,
- [8] Practical Applications of Photo-Defined Micro-Via Technology (PhotoLink(TM)) - 3rd International Symposium on Advanced Packaging Materials 3RD INTERNATIONAL SYMPOSIUM ON ADVANCED PACKAGING MATERIALS - PROCESSES, PROPERTIES, AND INTERFACES - PROCEEDINGS, 1997, : 24 - 28