Characterization of optical polarization converters made by femtosecond laser writing

被引:0
|
作者
de Jong, Christiaan J. [1 ,2 ]
Lajevardipour, Alireza [1 ]
Gecevicius, Mindaugas [3 ]
Beresna, Martynas [3 ]
Seniutinas, Gediminas [1 ]
Gervinskas, Gediminas [1 ]
Buividas, Ricardas [1 ]
Kazansky, Peter G. [3 ]
Bellouard, Yves [2 ]
Clayton, Andrew H. A. [1 ]
Juodkazis, Saulius [1 ,4 ]
机构
[1] Swinburne Univ Technol, Fac Engn & Ind Sci, Ctr Microphoton, Hawthorn, Vic 3122, Australia
[2] Eindhoven Univ Technol, Dept Mech Engn, NL-5600 MB Eindhoven, Netherlands
[3] Univ Southampton, Optoelect Res Ctr, Southampton SO17 1BJ, Hants, England
[4] Melborne Ctr Nanofabricat, Clayton, Vic 3168, Australia
基金
澳大利亚研究理事会;
关键词
FLIM; deep-UV; silica; defects; STRUCTURAL-CHARACTERIZATION; REGIONS; IRRADIATION; FABRICATION; SILICA; PURE; GEO2; GAN;
D O I
10.1117/12.2033928
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Recently, new types of silica polarization converters fabricated by femtosecond lasers have been introduced. These devices use spatially arranged nanogratings found under certain femtosecond laser exposure conditions in fused silica to create arbitrary polarization states by shaping spatially and locally the retardance of an incoming beam. Using this principle, radial and azimuthal polarization converters were demonstrated. These devices make use of a large density of femtosecond laser spots, introducing localized defects, affecting the performance of the converter. To optimize the writing and the post-processing annealing step of these kind of devices, here we introduce a novel fluorescence lifetime imaging microscope (FLIM) working with deep UV (240-280 nm) wavelength excitations. Specifically, we demonstrate the potential of this technique and more generally, how it can be used for characterizing a variety of femtosecond laser induced modifications in fused silica. This UV-FLIM can be used with micro-fluidic and bio-samples to characterize temporal characteristics of fluorescence.
引用
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页数:8
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