XMCD measurements of exchange biased PtMn/Co bilayers

被引：5
|
作者：
Antel, WJ
Hughes, T
Laidler, H [1 ]
Doherty, PJ
Johnston, A
机构：
[1] Univ York, Dept Phys, York YO10 5DD, N Yorkshire, England
[2] Seagate Technol Ireland, Londonderry BT48 0BF, North Ireland
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2002年 / 242卷
关键词：
exchange biasing; X-ray dichroism; dichroism-circular magnetic;
D O I：
10.1016/S0304-8853(01)01316-6
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The magnetic properties of a series of PtMn (tAngstrom)/Co (20Angstrom) (t = 50, 100, 150, 200Angstrom) exchange biased films are investigated using bulk magnetometry and X-ray magnetic circular dichroism (XMCD). From the bulk magnetometry measurements, the exchange field and coercivity is observed to increase with PtMn thickness. XMCD spectra are used to probe the interface region between the ferromagnetic Co and antiferromagnetic PtMn. The observed Mn XMCD is indicative of uncompensated Mn at the interface. These uncompensated Mn spins may be partially responsible for the increased coercivity observed in this exchange biased system. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：961 / 963
页数：3
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