Site-Specific Fragmentation of Polystyrene Molecule Using Size-Selected Ar Gas Cluster Ion Beam

被引：27
|
作者：
Moritani, Kousuke [1 ]
Mukai, Gen [1 ]
Hashinokuchi, Michihiro [1 ]
Mochiji, Kozo [1 ]
机构：
[1] Univ Hyogo, Grad Sch Engn, Dept Mech & Syst Engn, Himeji, Hyogo 6712201, Japan
来源：
APPLIED PHYSICS EXPRESS | 2009年 / 2卷 / 04期
基金：
日本科学技术振兴机构;
关键词：
MASS-SPECTROMETRY; SIMS; SURFACES;
D O I：
10.1143/APEX.2.046001
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The secondary ion mass spectrum (SIMS) of a polystyrene thin film was investigated using a size-selected Ar gas cluster ion beam (GCIB). The fragmentation in the SIM spectrum varied by kinetic energy per atom (E(atom)); the E(atom) dependence of the secondary ion intensity of the fragment species of polystyrene can be essentially classified into three types based on the relationship between E(atom) and the dissociation energy of a specific bonding site in the molecule. These results indicate that adjusting E(atom) of size-selected GCIB may realize site-specific bond breaking within a molecule. (C) 2009 The Japan Society of Applied Physics
引用
收藏
页码：0460011 / 0460013
页数：3
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