Signal processing for picosecond resolution timing measurements

被引:61
|
作者
Genat, Jean-Francois [1 ]
Varner, Gary [2 ]
Tang, Fukun [1 ]
Frisch, Henry [1 ]
机构
[1] Univ Chicago, Enrico Fermi Inst, Chicago, IL 60637 USA
[2] Univ Hawaii, Honolulu, HI 96822 USA
基金
美国国家科学基金会;
关键词
Fast timing; Picosecond; Signal processing; Sampling; Photo-detectors; Micro-channel plate; Photo-multiplier; Time-of-flight; ASIC;
D O I
10.1016/j.nima.2009.05.193
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The development of large-area homogeneous photo-detectors with sub-millimeter path-lengths for direct Cherenkov light and for secondary electrons opens the possibility of large time-of-flight systems for relativistic particles with resolutions in the picosecond range. Modern ASIC techniques allow fast multi-channel front-end electronics capable of sub-picosecond resolution directly integrated with the photo-detectors. However, achieving resolution in the picosecond range requires a precise knowledge of the signal generation process in order to understand the pulse waveform, the signal dynamics, and the noise induced by the detector itself, as well as the noise added by the processing electronics. Using the parameters measured for fast photo-detectors such as micro-channel plates photo-multipliers, we have simulated and compared the time resolutions for four signal processing techniques: leading edge discriminators, constant fraction discriminators, multiple-threshold discriminators and pulse waveform sampling. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:387 / 393
页数:7
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