Understanding the performance impact of the epidemic prevention cloud: an integrative model of the task-technology fit and status quo bias

被引:18
|
作者
Hsieh, Pi-Jung [1 ]
Lin, Weir-Sen [1 ]
机构
[1] Chia Nan Univ Pharm & Sci, Dept Hosp & Hlth Care Adm, 60,Sect 1,Erren Rd, Tainan 71710, Taiwan
关键词
Post-adoption resistance; task-technology fit; status quo bias; communicable disease surveillance report; system utilisation; performance impact; INFORMATION-SYSTEMS IMPLEMENTATION; USER RESISTANCE; ACCEPTANCE; DISEASES; SURVEILLANCE; LEADERSHIP; BANKING; SUCCESS; DELONE; USAGE;
D O I
10.1080/0144929X.2019.1624826
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The epidemic prevention cloud allows infection control professionals to streamline many of their reporting procedures, thereby improving patient safety in a cost-effective manner. Based on task-technology fit and status quo bias perspectives, this study develops an integrated model to explain individuals' health information technology usage behaviour. We conducted a field survey in 30 Taiwan hospitals to collect data from infection control professionals with using experience of the epidemic prevention cloud. A total of 167 questionnaires were sent out, and 116 were returned from 18 hospitals. To test the proposed research hypothesis, we employed a structural equation model by the partial least squares method. The results found that both task - (p < .01) and technology-related characteristics (p < .001) influence task-technology fit. Task-technology fit has a positive effect on both utilisation (p < .001) and performance (p < .001), while it appears to have a negative effect on resistance to use (p < .001). Our results showed that resistance to use was caused by uncertainty costs (p < .01) and perceived value (p < .01). The results indicate the significant effect of utilisation on performance (p < .01). Further, the results indicate a significant negative effect of resistance to use on utilisation (p < .05). This study illustrates the importance of incorporating post-adoption resistance in technology adoption studies
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页码:899 / 916
页数:18
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