Probing vibrational-electronic coupling at interfaces via doubly-resonant sum frequency spectroscopy

被引：0
|
作者：
Sengupta, Sanghamitra [1 ]
Elsenbeck, Dennis [2 ]
Raab, Micah [1 ]
Velarde, Luis [1 ]
机构：
[1] SUNY Buffalo, Dept Chem, Buffalo, NY USA
[2] SUNY Buffalo, Phys Chem, Orchard Pk, NY USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2018年 / 255卷
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D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
308
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页数：1
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