Soft X-ray absorption spectroscopy of the mgb2 boron K edge in an mgb2/mg composite

被引：2
|
作者：
Fischer, D. A. [1 ]
Moodenbaugh, A. R.
Li, Qiang
Gu, G. D.
Zhu, Yimei
Davenport, J. W.
Welch, D. O.
Su, Haibin
机构：
[1] Natl Inst Stand & Technol, Mat Sci & Engn Lab, Gaithersburg, MD 20899 USA
[2] Brookhaven Natl Lab, Upton, NY 11973 USA
来源：
MODERN PHYSICS LETTERS B | 2006年 / 20卷 / 19期
关键词：
soft X-ray absorption; MgB2; superconductor;
D O I：
10.1142/S0217984906011736
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Soft X-ray absorption spectroscopy (XAS), using fluorescence yield, was used to study the boron K near edge in MgB2 superconductor. The sample consists of MgB2 CryStallites randomly oriented in a magnesium matrix. Abrasion of the sample surface in vacuum provides a surface relatively free of boron-containing impurities. The intrinsic boron K near edge spectrum of the sample at a temperature of 295 K is identified. This spectrum is then compared in detail with a spectrum calculated using the full potential linearized augmented plane wave method. Features predicted by the theory appear near the expected energies, with qualitative agreement regarding shape and intensity.
引用
收藏
页码：1207 / 1216
页数：10
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