The magnetic and magneto-optic properties of the amorphous TbCo/Si multilayers

The Tb0.17Co0.83/Si multilayers prepared by a rf magnetron sputtering system with different Si thickness have been investigated. X-ray diffraction, magnetic measurement and Kerr rotation have been performed. With increasing thickness of Si layer t(Si), the perpendicular anisotropy constant K-u decreased rapidly. The saturation magnetization M-s and the Kerr rotation theta(K) decreased linearly when tsi increased. It was assumed that Co2Si and Tb had been formed in the interfacial zone between TbCo and Si layers. The reduction of K-u, M-s and theta(K) is attributed to the decrease of the effective thickness of magnetic layer, which is linear with t(Si).