Physical mechanism responsible for degradation of organic light-emitting diodes

被引：3

作者：

Lim, YouBong ^{[1
]}

Yoon, DongHee ^{[2
]}

Kim, HoonHee ^{[2
]}

Kim, DongJune ^{[2
]}

Choi, JungAe ^{[3
]}

Kim, JaeMan ^{[3
]}

Hwang, DooSup ^{[2
]}

Lee, YoungJin ^{[2
]}

Jeong, SooHoa ^{[2
]}

机构：

[1] Korea Adv Inst Sci & Technol, Dept Phys, Taejon 305701, South Korea

[2] LG Elect Inc, Prod Res Inst, Pyeongtaek Si 451713, Gyeonggi Do, South Korea

[3] LG Elect Inc, HE Co, Pyeongtaek Si 451713, Gyeonggi Do, South Korea

来源：

MICROELECTRONIC ENGINEERING | 2014年 / 129卷

关键词：

OLED; Degradation; SED; Arrhenius equation;

D O I：

10.1016/j.mee.2014.06.020

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Degradation of organic light-emitting diodes (OLEDs) is primarily due to the formation of the non-emissive centers, and their formation rate is dependent on the temperature. We observed the linear dependence of total luminance on the temperature, and formulated a novel degradation model to present an analytic function for the OLED degradation with physically meaningful fitting parameters. It was found that the stretched exponential decay (SED) behavior of the degradation is mainly due to the temperature dependence of the luminance. (C) 2014 Elsevier B.V. All rights reserved.

引用

页码：21 / 23

页数：3

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