X-ray dark-field and phase-contrast imaging using a grating interferometer

被引：81

作者：

Pfeiffer, F. ^{[1
]}

Bech, M. ^{[2
]}

Bunk, O. ^{[3
]}

Donath, T. ^{[3
]}

Henrich, B. ^{[3
]}

Kraft, P. ^{[3
]}

David, C. ^{[3
]}

机构：

[1] Tech Univ Munich, Dept Phys, D-85748 Garching, Germany

[2] Univ Copenhagen, Niels Bohr Inst, DK-2100 Copenhagen, Denmark

[3] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

来源：

JOURNAL OF APPLIED PHYSICS | 2009年 / 105卷 / 10期

关键词：

diffraction gratings; light interferometry; X-ray imaging; X-ray optics; SYNCHROTRON-RADIATION; TOMOGRAPHY; SCATTERING; MICROSCOPE; ANALYZER;

D O I：

10.1063/1.3115639

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In this letter, we report results obtained with a recently developed approach for grating-based x-ray dark-field imaging [F. Pfeiffer , Nat. Mater. 7, 134 (2008)]. Since the image contrast is formed through the mechanism of small-angle scattering, it provides complementary and otherwise inaccessible structural information about the specimen at the micron and submicron length scales. Our approach is fully compatible with conventional transmission radiography and the grating-based hard x-ray phase-contrast imaging scheme [F. Pfeiffer , Nat. Phys. 2, 258 (2006)]. Since it can be used with standard x-ray tube sources, we envisage widespread applications to x-ray medical imaging, industrial nondestructive testing, or security screening.

引用

页数：4

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