Development of a Cantilever calibration device

被引:2
|
作者
Dannberg, Oliver [1 ]
Kuehnel, Michael [2 ]
Froehlich, Thomas [3 ]
机构
[1] Tech Univ Ilmenau, Inst Prozessmess & Sensortech, Neuhaus 1, D-98693 Ilmenau, Germany
[2] SIOS Messtech GmbH, Vogelherd 46, D-98693 Ilmenau, Germany
[3] Tech Univ Ilmenau, Inst Prozessmess & Sensortech, Gustav Kirchhoff Str 1, D-98693 Ilmenau, Germany
关键词
Cantilever calibration; AFM-Cantilever; nanonewton; EMFC balance; FORCE;
D O I
10.1515/teme-2020-0064
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The measurement of small forces is required in various fields of science such as biology or physics. A common way to measure forces in the range of nano newton is to utilize AFM-Cantilevers as force sensors. Therefore it is necessarry to know the stiffness of the cantilever. Due to the manufacturing tolerances, each cantilever needs an individual calibration. The state-of-the-art calibration method with the lowest uncertainty is to measure the force-displacement curve whose slope corresponds the stiffness of the cantilever. In this article a novel device is presented that works according to this method. It uses an interferometer to measure the cantilever displacement and a custom load cell to measure the force. The load cell was calibrated in two different ways which lead to similar results. Finally, the measurement of a soft cantilever's stiffness is presentet to demonstrate the capabilities of the device.
引用
收藏
页码:622 / 629
页数:8
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