PXI Lowers Cost and Time to Market, First Choice in Test & Measurement Industry

被引：0
|
作者：
Drubin, Cliff
机构：
来源：
MICROWAVE JOURNAL | 2014年 / 57卷 / 10期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：52 / 52
页数：1
相关论文
共 20 条
  • [1] The first time is the hardest: A test of ordering effects in choice experiments
    Carlsson, Fredrik
    Morkbak, Morten Raun
    Olsen, Soren Boye
    JOURNAL OF CHOICE MODELLING, 2012, 5 (02) : 19 - 37
  • [2] The Impacts of Test Automation on Software's Cost, Quality and Time to Market
    Kumar, Divya
    Mishra, K. K.
    PROCEEDINGS OF INTERNATIONAL CONFERENCE ON COMMUNICATION, COMPUTING AND VIRTUALIZATION (ICCCV) 2016, 2016, 79 : 8 - 15
  • [3] The efficiency cost of market power in the banking industry: A test of the "quiet life" and related hypotheses
    Berger, AN
    Hannan, TH
    REVIEW OF ECONOMICS AND STATISTICS, 1998, 80 (03) : 454 - 465
  • [4] MEASUREMENT OF TRAVEL TIME VALUES AND OPPORTUNITY COST FROM A DISCRETE-CHOICE MODEL
    TRUONG, TP
    HENSHER, DA
    ECONOMIC JOURNAL, 1985, 95 (378): : 438 - 451
  • [5] Evaluating the choice of screening test for syphilis in the first trimester of pregnancy: a cost-effectiveness analysis
    Hersh, Alyssa R.
    Megli, Christina J.
    Caughey, Aaron B.
    AMERICAN JOURNAL OF OBSTETRICS AND GYNECOLOGY, 2018, 218 (01) : S525 - S526
  • [6] Faster time-to-market, lower cost of development and test for standard analog IC
    Migliavacca, P
    6TH IEEE INTERNATIONAL ON-LINE TESTING WORKSHOP, PROCEEDINGS, 2000, : 155 - 161
  • [7] Modular Solutions: Test With Confidence and Achieve Shorter Time-To-First Measurement
    Narduzzi, Mario
    MICROWAVE JOURNAL, 2015, 58 (03) : 78 - +
  • [8] A new test procedure for the choice of dependence structure in risk measurement: application to the US and UK stock market indices
    Shim, Jeungbo
    Lee, Eun-Joo
    Lee, Seung-Hwan
    APPLIED ECONOMICS, 2016, 48 (15) : 1382 - 1389
  • [9] New business models for standard and ASIC products in the semiconductor industry - Competing on cost and time-to-market
    Akella, R
    Kleinknecht, J
    Gillespie, J
    Kim, B
    Frederick, A
    ASMC 98 PROCEEDINGS - 1998 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE AND WORKSHOP: THEME - SEMICONDUCTOR MANUFACTURING: MEETING THE CHALLENGES OF THE GLOBAL MARKETPLACE, 1998, : 190 - 196
  • [10] Computerized 4-choice reaction time test for the measurement of psychomotor recovery after general anesthesia
    Taras I. Usichenko
    Danika Städing
    Michael Boesche
    Henriette Janner
    Thomas Hesse
    Robert Lehmann
    Dragan Pavlovic
    Andreas Nowak
    Journal of Clinical Monitoring and Computing, 2020, 34 : 833 - 841
12