Electro-optic time profile monitors for femtosecond electron bunches at the soft x-ray free-electron laser FLASH

被引：66
|
作者：
Steffen, B. [2 ,3 ]
Arsov, V. [2 ]
Berden, G. [1 ]
Gillespie, W. A. [4 ]
Jamison, S. P. [5 ]
MacLeod, A. M. [6 ]
van der Meer, A. F. G. [1 ]
Phillips, P. J. [4 ]
Schlarb, H. [2 ]
Schmidt, B. [2 ]
Schmueser, P. [2 ]
机构：
[1] FOM Inst Plasma Phys Rijnhuizen, Nieuwegein, Netherlands
[2] Deutsch Elektronen Synchrotron DESY, Hamburg, Germany
[3] Paul Scherrer Inst, Villigen, Switzerland
[4] Univ Dundee, Dundee, Scotland
[5] Accelerator Sci & Technol Ctr, STFC Daresbury Lab, Warrington, Cheshire, England
[6] Univ Abertay Dundee, Sch Comp & Adv Technol, Dundee, Scotland
来源：
PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS | 2009年 / 12卷 / 03期
基金：
英国工程与自然科学研究理事会;
关键词：
TERAHERTZ PULSES;
D O I：
10.1103/PhysRevSTAB.12.032802
中图分类号：
O57 [原子核物理学、高能物理学];
学科分类号：
070202 ;
摘要：
Precise measurements of the temporal profile of ultrashort electron bunches are of high interest for the optimization and operation of ultraviolet and x-ray free-electron lasers. The electro-optic (EO) technique has been applied for a single-shot direct visualization of the time profile of individual electron bunches at FLASH. This paper presents a thorough description of the experimental setup and the results. An absolute calibration of the EO technique has been performed utilizing simultaneous measurements with a transverse-deflecting radio-frequency structure that transforms the longitudinal bunch charge distribution into a transverse streak. EO signals as short as 60 fs (rms) have been observed using a gallium-phosphide (GaP) crystal, which is a new record in the EO detection of single electron bunches and close to the physical limit imposed by the EO material properties. The data are in quantitative agreement with a numerical simulation of the EO detection process.
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页数：16
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