Bulk etch rates of CR-39 at high etchant concentrations: diffusion-limited etching

被引:4
|
作者
Awad, E. M. [1 ]
Rana, M. A. [2 ]
Al-Jubbori, Mushtaq Abed [3 ]
机构
[1] Menoufia Univ, Fac Sci, Phys Dept, Menoufia 32511, Egypt
[2] Instrumentat Control & Comp Complex ICCC, MERADD, PARAS Bldg,18 KM Multan Rd,PO Chung, Lahore, Pakistan
[3] Univ Mosul, Coll Educ Pure Sci, Dept Phys, Mosul 41001, Iraq
关键词
CR-39; detector; Ethanol; Bulk etch rate; Reduced bulk etch rate; Diffusion-limited etching; Concentration-limited etching; NUCLEAR TRACK DETECTOR; PADC; POLYMER; MODEL; NAOH; TEMPERATURE; ETHANOL; RANGE; ALPHA;
D O I
10.1007/s41365-020-00830-6
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
Systematic CR-39 bulk etching experiments were conducted over a wide range of concentrations (2-30 N) of NaOH-based etchant. Critical analysis and a deep discussion of the results are presented. A comprehensive nuclear track chemical etching data bank was developed. Three regimes of CR-39 bulk etching were identified. Regime I spans etchant concentrations from 2 to 12 N. Regime II spans concentrations from 12 to 25 N. We call this the dynamic bulk etching regime. Regime III is for concentrations greater than 25 N. In this regime, the bulk etch rate is saturated with respect to the etchant concentration. This classification is discussed and explained. The role of ethanol in NaOH-based etchants is explored and discussed. A parameter called the "reduced bulk etch rate" is defined here, which helps in analyzing the dependence of bulk etching on the amount of ethanol in the etchant. The bulk etch rate shows a natural logarithmic dependence on the density of ethanol in the etchant.
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页数:9
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