Hot-swap MOSFET reliability

被引：0
|
作者：
Ball, A
机构：
来源：
EDN | 2004年 / 49卷 / 07期
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
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页码：59 / 60
页数：2
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