Oxidation of deposited Aun (n=2-13) on SiO2/Si: Influence of the NaOH(aq) treatment

被引：11

作者：

Lim, Dong Chan ^{[3
]}

Dietsche, Rainer ^{[2
]}

Gantefoer, Gerd ^{[2
]}

Kim, Young Dok ^{[1
]}

机构：

[1] Sungkyunkwan Univ, Dept Chem, Suwon 440746, Gyeonggi Do, South Korea

[2] Univ Konstanz, Dept Phys, D-78457 Constance, Germany

[3] Korea Inst Mat Sci, Dept Surface Technol, Chang Won 641010, South Korea

来源：

CHEMICAL PHYSICS | 2009年 / 359卷 / 1-3期

关键词：

Au; Cluster; Oxidation; X-ray photoelectron spectroscopy; CLUSTER ANIONS; CHEMICAL-PROPERTIES; GOLD; COPPER; OXYGEN; CO;

D O I：

10.1016/j.chemphys.2009.03.023

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Au cluster anions consisting of 2-13 atoms were soft-landed on native-oxide-covered Si wafers. Reaction of soft-landed clusters with an atomic oxygen atmosphere was studied using X-ray photoelectron spectroscopy (XPS). Au-5, Au-7, and Au-13 turned out to show pronounced inertness for Au-oxide formation. When the samples with deposited Au clusters were treated with aqueous NaOH, the inert Au-5, Au-7, and Au-13 clusters became reactive towards Au-oxide formation, whereas the other originally reactive clusters became inert. This result can be interpreted in terms of electronic modification of Au clusters by Na, which was also evidenced by Au 4f and Na 1s core level shifts. (C) 2009 Elsevier B.V. All rights reserved,

引用

页码：161 / 165

页数：5

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