Micromagnetics of magnetization reversal in patterned magnetic recording medium

被引：6
|
作者：
E, Chunsheng [1 ]
Smith, Darren
Khizroev, Sakhrat
Weller, Dieter
Litvinov, Dmitri
机构：
[1] Univ Houston, Ctr Nanomagnet Syst, Houston, TX 77204 USA
[2] Florida Int Univ, Dept Elect & Comp Engn, Miami, FL 33174 USA
[3] Seagate Technol, Fremont, CA 94538 USA
来源：
IEEE TRANSACTIONS ON MAGNETICS | 2006年 / 42卷 / 10期
基金：
美国国家科学基金会;
关键词：
bit magnetization reversal; micromagnetics; patterned medium recording;
D O I：
10.1109/TMAG.2006.878397
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Selected aspects of the recording physics of data storage systems based on patterned magnetic recording medium are discussed. The micromagnetic study of the magnetization reversal in patterned magnetic recording medium is presented. The effects of bit size, head/medium misregistration, bit-to-bit spacing, soft underlayer (SUL) patterning, and side wall roughness on magnetization reversal are explored. The results offer the guidelines for the design and optimization of patterned magnetic recording medium.
引用
收藏
页码：2411 / 2413
页数：3
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