3D hydrogen microscopy with sub-ppm detection limit

被引:24
|
作者
Reichart, P [1 ]
Dollinger, G [1 ]
Bergmaier, A [1 ]
Datzmann, G [1 ]
Hauptner, A [1 ]
Körner, HJ [1 ]
Krücken, R [1 ]
机构
[1] Tech Univ Munich, Dept Phys E12, D-85748 Garching, Germany
关键词
hydrogen analysis; 3D hydrogen imaging; proton-proton scattering; proton microprobe; irradiation damage; CVD diamond;
D O I
10.1016/j.nimb.2004.01.200
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Coincident elastic proton-proton scattering at a 17 MeV microprobe is used to investigate hydrogen distributions on microscopic scale inside freestanding samples up to some 100 mum thickness. Hydrogen imaging at atomic ppm level needs a total count rate of about 100 kHz of scattered protons in order to get sufficient statistics from the small fraction of coincident hydrogen signals. It is obtained using a highly segmented silicon strip detector of 2.3 sr for proton currents of less than 100 pA impinging on films thicker 10 mum. A five level filter almost completely suppresses accidental coincidences. The sensitivity of this kind of 3D hydrogen microscopy is demonstrated by the analysis of a 55 mum thick synthetic diamond layer showing a detection limit of 0.08 at-ppm hydrogen. In addition, the proposed depth resolution of 3-6 mum is experimentally confirmed and a lateral resolution of 0.6 mum full width half maximum is obtained at a significant hydrogen enhancement inside the layer. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:980 / 987
页数:8
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