Learning of Multi-Dimensional Analog Circuits Through Generative Adversarial Network (GAN)

被引:1
|
作者
Dutta, Rahul [1 ]
Raju, Salahuddin [1 ]
James, Ashish [1 ]
Leo, Chemmanda John [1 ]
Jeon, Yong-Joon [1 ]
Unnikrishnan, Balagopal [1 ]
Foo, Chuan Sheng [1 ]
Zeng, Zeng [1 ]
Chai, Kevin Tshun Chuan [1 ]
Chandrasekhar, Vijay R. [1 ]
机构
[1] ASTAR, Fusionopolis Way, Singapore 138632, Singapore
关键词
Analog and mixed-signal circuits; machine learning; semi-supervised learning; generative adversarial network;
D O I
10.1109/SOCC46988.2019.1570548547
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Analog circuits are strictly designed under operational, functional and technology constraints. Together, these bounds create a sparse multi-dimensional design optimization space with the scarcity of labeled analog training data making supervised learning methods ineffective. Accurate approximation of multi-target analog circuits, therefore, requires generation of labeled data around dominant bias and with relevant variance. With such an approach, we explore state-of-the-art semi-supervised, generative adversarial network (GAN) towards analog performance modeling. We report on various multi-target analog circuit classification experiments and demonstrate stable GAN performance achieving 2-5% higher accuracy and utilizing only 10% fully simulated manually annotated labeled data against supervised learning methods.
引用
收藏
页码:394 / 399
页数:6
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