The Melting Characteristics and Interfacial Reactions of Sn-ball/Sn-3.0Ag-0.5Cu-paste/Cu Joints During Reflow Soldering

被引:9
|
作者
Huang, J. Q. [1 ,2 ]
Zhou, M. B. [1 ]
Zhang, X. P. [1 ,2 ]
机构
[1] South China Univ Technol, Sch Mat Sci & Engn, Guangzhou 510640, Guangdong, Peoples R China
[2] South China Univ Technol, Guangdong Prov Engn R&D Ctr Elect Packaging Mat &, Guangzhou 510640, Guangdong, Peoples R China
基金
中国国家自然科学基金;
关键词
Lead-free solder joint; ball grid array; interfacial reaction; premelting behavior; differential scanning calorimetry; SN-PB SOLDER; INTERMETALLIC COMPOUND; CU SUBSTRATE; GROWTH; RELIABILITY; KINETICS; MICROSTRUCTURE; INTERCONNECTS; TECHNOLOGY; BEHAVIOR;
D O I
10.1007/s11664-016-5189-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this work, the melting characteristics and interfacial reactions of Sn-ball/Sn-3.0Ag-0.5Cu-paste/Cu (Sn/SAC305-paste/Cu) structure joints were studied using differential scanning calorimetry, in order to gain a deeper and broader understanding of the interfacial behavior and metallurgical combination among the substrate (under-bump metallization), solder ball and solder paste in a board-level ball grid array (BGA) assembly process, which is often seen as a mixed assembly using solder balls and solder pastes. Results show that at the SAC305 melting temperature of 217A degrees C, neither the SAC305-paste nor the Sn-ball coalesce, while an interfacial reaction occurs between the SAC305-paste and Cu. A slight increase in reflow temperature (from 217A degrees C to 218A degrees C) results in the coalescence of the SAC305-paste with the Sn-ball. The Sn-ball exhibits premelting behavior at reflow temperatures below its melting temperature, and the premelting direction is from the bottom to the top of the Sn-ball. Remarkably, at 227A degrees C, which is nearly 5A degrees C lower than the melting point of pure Sn, the Sn-ball melts completely, resulting from two eutectic reactions, i.e., the reaction between Sn and Cu and that between Sn and Ag. Furthermore, a large amount of bulk Cu6Sn5 phase forms in the solder due to the quick dissolution of Cu substrate when the reflow temperature is increased to 245A degrees C. In addition, the growth of the interfacial Cu6Sn5 layer at the SAC305-paste/Cu interface is controlled mainly by grain boundary diffusion, while the growth of the interfacial Cu3Sn layer is controlled mainly by bulk diffusion.
引用
收藏
页码:1504 / 1515
页数:12
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