Rapid prototyping of coupled photonic cavities by focused ion beam/photolithography hybrid technique

被引:1
|
作者
Viegas, Jaime [1 ]
Xing, Peng [1 ]
机构
[1] Masdar Inst Sci & Technol, Abu Dhabi, U Arab Emirates
关键词
Focused ion beam fabrication; nanofabrication; coupled photonic cavities;
D O I
10.1117/12.2040270
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Hybrid photolithography and focused ion beam (FIB) patterning of coupled photonic cavities is reported. This technique is used for rapid prototyping of nanophotonic devices, where previously mass-produced devices by conventional lithography steps, such as photolithography, projection lithography or nano/micro-imprinting can be customized by a versatile approach on a focused ion beam microscope. This requires accurate positioning of the FIB pattern relative to the pre-patterned devices and minimal drift during the writing phase. Various fabrication parameters that mimic process variability can be studied and the obtained experimental results compared with numerical simulations of the fabricated devices. This allows the calibration of the simulation models for more accurate design to manufacturing predictability. As a proof of concept, the experimental optimization of the localized modes in a photonic molecule formed by placing two one-dimensional photonic crystal cavities on a nanowire coupler is reported. The effects of different photonic crystal geometry, material removal depth and rate, sidewall profile and roughness, patterning drift on the performance of the photonic molecule resonator are investigated. These fabricated photonic molecule devices can be used as refractive index sensors with measured sensitivities on the order of 400 nm/RIU with a sensing volume as low as 18 femtoliters. The dimensions of the fabricated devices and the understanding of their optical behavior on environmental influence open the door for near-field optical spectroscopy of single bacterial specimens.
引用
收藏
页数:7
相关论文
共 50 条
  • [1] Rapid prototyping of nanostructured materials with a focused ion beam
    Wilhelmi, Oliver
    Reyntjens, Steve
    Mitterbauer, Christoph
    Roussel, Laurent
    Stokes, Debbie J.
    Hubert, Dominique H. W.
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (06) : 5010 - 5014
  • [2] Rapid prototyping of two-dimensional photonic crystal devices by a dual beam focused ion beam system
    Stomeo, T
    Visimberga, G
    Todaro, MT
    Passaseo, A
    Cingolani, R
    De Vittorio, M
    Cabrini, S
    Carpentiero, A
    Di Fabrizio, E
    MICROELECTRONIC ENGINEERING, 2005, 78-79 : 417 - 421
  • [3] Rapid prototyping of magnetic tunnel junctions with focused ion beam processes
    Persson, Anders
    Thornell, Greger
    Nguyen, Hugo
    JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 2010, 20 (05)
  • [4] Focused-ion-beam-based rapid prototyping of nanoscale magnetic devices
    Khizroev, S
    Litvinov, D
    NANOTECHNOLOGY, 2004, 15 (03) : R7 - R15
  • [5] Rapid prototyping of grating magneto-optical traps using a focused ion beam
    Sun, Xiao
    Rickard, William D. A.
    Sparkes, Ben M.
    White, Ben R.
    Offer, Rachel F.
    Luiten, Andre N.
    Ironside, Charlie N.
    OPTICS EXPRESS, 2021, 29 (23) : 37733 - 37746
  • [6] The NanoPirani - an extremely miniaturized pressure sensor fabricated by focused ion beam rapid prototyping
    Puers, R
    Reyntjens, S
    De Bruyker, D
    SENSORS AND ACTUATORS A-PHYSICAL, 2002, 97-8 : 208 - 214
  • [7] Integrated lasers in crystalline double tungstates with focused-ion-beam nanostructured photonic cavities
    Ay, F.
    Inurrategui, I.
    Geskus, D.
    Aravazhi, S.
    Pollnau, M.
    LASER PHYSICS LETTERS, 2011, 8 (06) : 423 - 430
  • [8] Focused ion beam milling for prototyping 2D and 3D photonic structures
    Sloyan, Karen
    Melkonyan, Henrik
    Dahlem, Marcus S.
    INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2020, 107 (11-12): : 4469 - 4480
  • [9] Focused ion beam milling for prototyping 2D and 3D photonic structures
    Karen Sloyan
    Henrik Melkonyan
    Marcus S. Dahlem
    The International Journal of Advanced Manufacturing Technology, 2020, 107 : 4469 - 4480
  • [10] Formation of coupled-cavities in quantum cascade lasers using focused ion beam milling
    Czerwinski, Andrzej
    Pluska, Mariusz
    Laszcz, Adam
    Ratajczak, Jacek
    Pierscinski, Kamil
    Piersciniska, Dorota
    Gutowski, Piotr
    Karbownik, Piotr
    Bugajski, Maciej
    MICROELECTRONICS RELIABILITY, 2015, 55 (9-10) : 2142 - 2146