Defect-Induced Ultrafast Nonadiabatic Electron-Hole Recombination Process in PtSe2 Monolayer

被引:4
|
作者
Huang, Hongfu [1 ]
Peng, Junhao [1 ]
Li, Zixuan [1 ]
Dong, Huafeng [1 ,3 ]
Huang, Le [2 ]
Wen, Minru [1 ]
Wu, Fugen [2 ,3 ]
机构
[1] Guangdong Univ Technol, Sch Phys & Optoelect Engn, Guangzhou 510006, Peoples R China
[2] Guangdong Univ Technol, Sch Mat & Energy, Guangzhou 510006, Peoples R China
[3] Guangdong Univ Technol, Guangdong Prov Key Lab Informat Photon Technol, Guangzhou 510006, Peoples R China
基金
中国国家自然科学基金;
关键词
DENSITY; TRANSITION;
D O I
10.1021/acs.jpclett.2c03306
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Defects are inevitable in two-dimensional materials due to the growth condition, which results in many unexpected changes in materials' properties. Here, we have mainly discussed the nonradiative recombination dynamics of PtSe2 monolayer without/ with native point defects. Based on first-principles calculations, a shallow p-type defect state is introduced by a Se antisite, and three n-type defect states with a double-degenerate shallow defect state and a deep defect state are introduced by a Se vacancy. Significantly, these defect states couple strongly to the pristine valence band maximum and lead to the enhancement of the in-plane vibrational E-g mode. Both factors appreciably increase the nonadiabatic coupling, accelerating the electron-hole recombination process. An explanation of PtSe2-based photodetectors with the slow response, compared to conventional devices, is provided by studying this nonradiative transitions process.
引用
收藏
页码:10988 / 10993
页数:6
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