Investigation of enhancement-mode AlGaN/GaN nanowire channel high-electron-mobility transistor with oxygen-containing plasma treatment

被引:16
|
作者
He, Yunlong [1 ]
Wang, Chong [1 ]
Mi, Minhan [1 ]
Zhang, Meng [2 ]
Zhu, Qing [2 ]
Zhang, Peng [2 ]
Wu, Ji [1 ]
Zhang, Hengshuang [1 ]
Zheng, Xuefeng [1 ]
Yang, Ling [2 ]
Duan, Xiaoling [1 ]
Ma, Xiaohua [2 ]
Hao, Yue [1 ]
机构
[1] Xidian Univ, Sch Microelect, Key Lab Wide Band Gap Semicond Mat & Devices, Xian 710071, Peoples R China
[2] Xidian Univ, Sch Adv Mat & Nanotechnol, Xian 710071, Peoples R China
基金
中国国家自然科学基金;
关键词
HEMTS; PERFORMANCE;
D O I
10.7567/APEX.10.056502
中图分类号
O59 [应用物理学];
学科分类号
摘要
A novel enhancement-mode (E-mode) AlGaN/GaN high-electron-mobility transistor (HEMT) has been fabricated, by combining nanowire channel (NC) structure fabrication and N2O (or O-2) plasma treatment. A comparison of two NC-HEMTs with different plasma treatments has been made. The NC-HEMT with N2O plasma treatment shows an output current of 610mA/mm and a peak transconductance of 450 mS/mm. The DIBL of the NC-HEMT with N2O plasma treatment is as low as 2mV/V, and an SS of 70mV/decade is achieved. The device exhibits an intrinsic current gain cutoff frequency f(T) of 19GHz and a maximum oscillation frequency f(max) of 58 GHz. (C) 2017 The Japan Society of Applied Physics
引用
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页数:4
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