Deep Adversarial Data Augmentation for Fabric Defect Classification With Scarce Defect Data

被引:17
|
作者
Lu, Bingyu [1 ,2 ]
Zhang, Meng [1 ,2 ]
Huang, Biqing [1 ,2 ]
机构
[1] Tsinghua Univ, Beijing Natl Res Ctr Informat Sci & Technol, Beijing 100084, Peoples R China
[2] Tsinghua Univ, Dept Automat, Beijing 100084, Peoples R China
关键词
Fabrics; Training; Feature extraction; Task analysis; Robustness; Classification algorithms; Support vector machines; Adversarial training; data scarcity; deep neural network (DNN); fabric defect classification; image augmentation;
D O I
10.1109/TIM.2022.3185609
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Fabric defect classification is a crucial and challenging task for fabric production quality guarantee. In recent years, many deep neural network-based methods have been proposed and shown promising performance on this task. However, it would be laborious and time-consuming to collect enough defect images to satisfy high-quality training because defects are too rare in factories. In this article, we propose a deep adversarial data augmentation method named DefectTransfer to address the defect data scarcity issue. Since the defect may happen anywhere on the background texture with any size, we consider the position and size of a defect should not be fully linked to the background texture in the network training. Based on this assumption, we design a cut-paste approach to augment the defect images by cutting out defects and pasting them on defect-free images. The defects are randomly transformed with scaling, rotating, and moving before the paste operation. To make the network training more efficient, we further propose an adversarial transformation algorithm that adjusts the pasted defects targeting the weakness of the classification network. The high diversity of the adversarial synthetic defect images forces the network to learn more discriminative category features. Experimental results show that our method can achieve comparable performance with recent fabric defect classification methods with only 1% fabric defect data on the ZJU-Leaper dataset. DefectTransfer also largely surpasses traditional augmentation methods even without manually annotated masks.
引用
收藏
页数:13
相关论文
共 50 条
  • [1] Deep Adversarial Data Augmentation for Fabric Defect Classification With Scarce Defect Data
    Lu, Bingyu
    Zhang, Meng
    Huang, Biqing
    IEEE Transactions on Instrumentation and Measurement, 2022, 71
  • [2] Data Augmentation Method For Fabric Defect Detection
    Wang, Po-Hsiang
    Lin, Chien-Chou
    2022 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS - TAIWAN, IEEE ICCE-TW 2022, 2022, : 255 - 256
  • [3] Scarcity-GAN: Scarce data augmentation for defect detection via generative adversarial nets
    Xu, Chaobin
    Li, Wei
    Cui, Xiaohui
    Wang, Zhenyu
    Zheng, Fengling
    Zhang, Xiaowu
    Chen, Bin
    NEUROCOMPUTING, 2024, 566
  • [4] FabricGAN: an enhanced generative adversarial network for data augmentation and improved fabric defect detection
    Xu, Yiqin
    Zhi, Chao
    Wang, Shuai
    Chen, Jianglong
    Sun, Runjun
    Dong, Zijing
    Yu, Lingjie
    TEXTILE RESEARCH JOURNAL, 2024, 94 (15-16) : 1771 - 1785
  • [5] Synthetic data augmentation for surface defect detection and classification using deep learning
    Saksham Jain
    Gautam Seth
    Arpit Paruthi
    Umang Soni
    Girish Kumar
    Journal of Intelligent Manufacturing, 2022, 33 : 1007 - 1020
  • [6] Synthetic data augmentation for surface defect detection and classification using deep learning
    Jain, Saksham
    Seth, Gautam
    Paruthi, Arpit
    Soni, Umang
    Kumar, Girish
    JOURNAL OF INTELLIGENT MANUFACTURING, 2022, 33 (04) : 1007 - 1020
  • [7] Conditional image-to-image translation generative adversarial network (cGAN) for fabric defect data augmentation
    Mohammed, Swash Sami
    Clarke, Hülya Gökalp
    Neural Computing and Applications, 2024, 36 (32) : 20231 - 20244
  • [8] Minimization of CNN Training Data by using Data Augmentation for Inline Defect Classification
    Fujishiro, Akihiro
    Nagamura, Yoshikazu
    Usami, Tatsuya
    Inoue, Masao
    2020 INTERNATIONAL SYMPOSIUM ON SEMICONDUCTOR MANUFACTURING (ISSM), 2020,
  • [9] DADA: DEEP ADVERSARIAL DATA AUGMENTATION FOR EXTREMELY LOW DATA REGIME CLASSIFICATION
    Zhang, Xiaofeng
    Wang, Zhangyang
    Liu, Dong
    Ling, Qing
    2019 IEEE INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH AND SIGNAL PROCESSING (ICASSP), 2019, : 2807 - 2811
  • [10] Wafer map defect classification using deep learning framework with data augmentation on imbalance datasets
    Tsai, Tsung-Han
    Wang, Chieng-Yang
    EURASIP JOURNAL ON IMAGE AND VIDEO PROCESSING, 2025, 2025 (01)