Provably Optimal Test Cube Generation using Quantified Boolean Formula Solving

Circuits that employ test pattern compression rely on test cubes to achieve high compression ratios. The less inputs of a test pattern are specified, the better it can be compacted and hence the lower the test application time. Although there exist previous approaches to generate such test cubes, none of them are optimal. We present for the first time a framework that yields provably optimal test cubes by using the theory of quantified Boolean formulas (QBF). Extensive comparisons with previous methods demonstrate the quality gain of the proposed method.