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- [3] Direct observations of defect structures in optoelectronic materials by Z-contrast stem ELECTRON MICROSCOPY 1998, VOL 3: MATERIALS SCIENCE 2, 1998, : 427 - 428
- [4] Z-Contrast Imaging of Grain-Boundary Core Structures in Semiconductors MRS Bulletin, 1997, 22 : 53 - 57
- [6] Direct observations of atomic structures of defects in GaN by high resolution Z-contrast stem NITRIDE SEMICONDUCTORS, 1998, 482 : 781 - 786
- [7] Z-contrast Imaging and EELS of dislocation cores at the Si/GaAs interface PROGRESS IN SEMICONDUCTORS II- ELECTRONIC AND OPTOELECTRONIC APPLICATIONS, 2003, 744 : 25 - 28
- [9] HIGH-RESOLUTION IMAGING OF SEMICONDUCTOR INTERFACES BY Z-CONTRAST STEM INSTITUTE OF PHYSICS CONFERENCE SERIES, 1989, (100): : 51 - 58
- [10] Modelling thermal scattering and solving structures using Z-contrast imaging ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2011, 67 : C155 - C156