An Introduction to Statistical Issues and Methods in Metrology for Physical Science and Engineering

被引:3
|
作者
Vardeman, Stephen [1 ,2 ]
Hamada, Michael S. [3 ]
Burr, Tom [3 ]
Morris, Max [1 ,2 ]
Wendelberger, Joanne [3 ]
Jobe, J. Marcus [4 ]
Moore, Leslie [3 ]
Wu, Huaiquing [1 ]
机构
[1] Iowa State Univ, Dept Stat, Ames, IA 50011 USA
[2] Iowa State Univ, Dept Ind & Mfg Syst, Ames, IA 50011 USA
[3] Los Alamos Natl Lab, Stat Sci Grp, Los Alamos, NM 87545 USA
[4] Miami Univ, Farmer Sch Business, Oxford, OH 45056 USA
关键词
Accuracy; Bayesian; Calibration; Control Chart; Frequentist; Gauge R&R; Linearity; Measurement Error; One- and Two-Sample Problems; Precision; Quantization Error; Random-Effects Model; Regression; Repeatability; Reproducibility; Stability; Type A and B Uncertainties; Validity; INTERVAL ESTIMATION; MEASUREMENT ERROR; ROUNDING ERROR;
D O I
10.1080/00224065.2014.11917953
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This article provides an overview of the interplay between statistics and measurement. Measurement quality affects inference from data collected and analyzed using statistical methods while appropriate data analysis quantifies the quality of measurements. This article brings material on statistics and measurement together in one place as a resource for practitioners. Both frequentist and Bayesian methods are discussed.
引用
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页码:33 / 62
页数:30
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