Effect of plasma composition on nanocrystalline diamond layers deposited by a microwave linear antenna plasma-enhanced chemical vapour deposition system

被引:18
|
作者
Taylor, Andrew [1 ,2 ]
Ashcheulov, Petr [1 ,3 ]
Cada, Martin [1 ]
Fekete, Ladislav [1 ]
Hubik, Pavel [1 ]
Klimsa, Ladislav [1 ]
Olejnicek, Jiri [1 ]
Remes, Zdenek [1 ,2 ]
Jirka, Ivan [4 ]
Janicek, Petr [5 ]
Bedel-Pereira, Elena [6 ]
Kopecek, Jaromir [1 ]
Mistrik, Jan [5 ]
Mortet, Vincent [1 ,2 ]
机构
[1] ASCR, Inst Phys, Vvi, Prague, Czech Republic
[2] Czech Tech Univ, Fac Biomed Engn, CR-16635 Prague, Czech Republic
[3] Czech Tech Univ, Fac Nucl Phys & Phys Engn, CR-16635 Prague, Czech Republic
[4] ASCR, J Heyrovsky Inst Phys Chem, Vvi, Prague, Czech Republic
[5] Univ Pardubice, Inst Appl Phys & Math, Pardubice, Czech Republic
[6] CNRS, LAAS, F-31031 Toulouse, France
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2015年 / 212卷 / 11期
关键词
diamond; electrical conductivity; nanocrystalline materials; optical emission spectroscopy; plasma enhanced chemical vapour deposition; SiC; THIN-FILMS; LARGE-AREA; OXYGEN; CVD;
D O I
10.1002/pssa.201532183
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The addition of CO2 into the process gas has a significant impact on the quality and the incorporation of boron in CVD diamond layers. In this report we study the effect of CO2 addition in the gas phase on the properties of boron doped nano-crystalline diamond (BNCD) layers grown at low substrate temperatures (450-500 degrees C) using a microwave linear antenna plasma-enhanced chemical vapour deposition apparatus (MW-LA-PECVD). Experimental results show an increase in the layers' conductivity with a reduction in CO2 concentration, which is consistent with the variation in the atomic boron emission line intensity measured by optical emission spectroscopy (OES). At CO2 concentrations close to zero, we observed the formation of a smooth, transparent and highly resistive layer on unseeded substrates. This layer has been identified as silicon carbide (SiC) by transmission electron microscopy and X-ray photoelectron microscopy. The presence of silicon in the plasma is confirmed by OES and it is attributed to quartz tube etching. In this specific deposition condition, diamond growth is in competition with SiC growth, which affects the diamond layer properties. (C) 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:2418 / 2423
页数:6
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