Comparative study of ZnO thin films deposited by various methods for use as sensors

被引：2
|
作者：
Behera, D [1 ]
Acharya, BS [1 ]
机构：
[1] Reg Res Lab, Bhubaneswar 751013, Orissa, India
来源：
IONICS | 2004年 / 10卷 / 1-2期
关键词：
D O I：
10.1007/BF02410327
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Good and adhesive semiconducting films of ZnO (approximate to 100-1100 nm) were deposited over planar borosilicate glass by spray pyrolysis and dip & dry method. The films were characterized by Xray diffraction and optical absorption measurements. The band gap of these films were found to be 3.21 eV and the films were randomly oriented having average crystallite sizes of 20 to 25 nm.
引用
收藏
页码：155 / 158
页数：4
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