Current Voltage Characteristics of a Metallic Structure for a Hot-Carrier Photovoltaic Cell

被引:0
|
作者
Dimmock, James A. R. [1 ,2 ]
Kauer, Matthias [1 ]
Mellor, Alex V. [2 ]
Stavrinou, Paul N. [2 ]
Ekins-Daukes, Nicholas J. [2 ]
机构
[1] Sharp Labs Europe Ltd, Oxford OX4 4GB, England
[2] Imperial Coll London, Blackett Lab, London SW7 2AZ, England
关键词
D O I
暂无
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
We demonstrate a solar cell based on a thin layer of metal directly deposited on an n-doped semiconductor structure, forming a Schottky barrier acting as a semi-selective contact for an electron temperature driven cell. Absorption of light is shown to be by free carrier absorption in the metal layer for illumination with wavelengths of light below the semiconductor band gap, giving rise to an IV characteristic with a reverse bias slope dependent on electron temperature. Illumination with light in excess of the band gap reveals a standard Schottky cell IV characteristic.
引用
收藏
页码:1043 / 1046
页数:4
相关论文
共 50 条
  • [1] A metallic hot-carrier photovoltaic device
    Dimmock, James A. R.
    Kauer, Matthias
    Wu, Jiang
    Liu, Huiyun
    Stavrinou, Paul N.
    Ekins-Daukes, Nicholas J.
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2019, 34 (06)
  • [2] Demonstration of a hot-carrier photovoltaic cell
    Dimmock, James A. R.
    Day, Stephen
    Kauer, Matthias
    Smith, Katherine
    Heffernan, Jon
    PROGRESS IN PHOTOVOLTAICS, 2014, 22 (02): : 151 - 160
  • [3] A metallic hot carrier photovoltaic cell
    Dimmock, J. A. R.
    Kauer, M.
    Stavrinou, P. N.
    Ekins-Daukes, N. J.
    PHYSICS SIMULATION AND PHOTONIC ENGINEERING OF PHOTOVOLTAIC DEVICES IV, 2015, 9358
  • [4] Current-voltage curves and operational stability in hot-carrier solar cell
    Kamide, K.
    JOURNAL OF APPLIED PHYSICS, 2020, 127 (18)
  • [5] Current-voltage curves and operational stability in hot-carrier solar cell
    Kamide, K.
    Journal of Applied Physics, 2020, 127 (18):
  • [6] THRESHOLD-VOLTAGE INSTABILITY CAUSED BY THE HOT-CARRIER SUBSTRATE CURRENT IN MOSFETS
    ELHENNAWY, AE
    ALBARAKATI, GG
    ALHARBI, TS
    INTERNATIONAL JOURNAL OF ELECTRONICS, 1993, 75 (01) : 49 - 55
  • [7] RECOVERY OF THRESHOLD VOLTAGE AFTER HOT-CARRIER STRESSING
    ONG, TC
    LEVI, M
    KO, PK
    HU, CM
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1988, 35 (07) : 978 - 984
  • [8] Hot-carrier aging simulations of a voltage controlled oscillator
    Koike, N
    Nishimura, H
    Takeo, M
    Morii, T
    Tatsuuma, K
    IEICE TRANSACTIONS ON ELECTRONICS, 1996, E79C (09) : 1285 - 1288
  • [9] Hot-carrier effects on power characteristics of SiGeHBTs
    Huang, SY
    Chen, KM
    Huang, GW
    Tseng, HC
    Hsu, TL
    Chang, CY
    Huang, TY
    IEEE ELECTRON DEVICE LETTERS, 2004, 25 (06) : 393 - 395
  • [10] Optoelectronic characterization of carrier extraction in a hot carrier photovoltaic cell structure
    Dimmock, James A. R.
    Kauer, Matthias
    Smith, Katherine
    Liu, Huiyun
    Stavrinou, Paul N.
    Ekins-Daukes, Nicholas J.
    JOURNAL OF OPTICS, 2016, 18 (07)