Development of a portable free-air ionization chamber as an absolute intensity monitor for high-energy synchrotron radiation up to 150 keV

被引:18
|
作者
Nariyama, N
Kishi, N
Ohnishi, S
机构
[1] Japan Synchtotron Radiat Res Inst, Beamline Div, Sayo, Hyogo 6795198, Japan
[2] Kyoto Univ, Sakyo Ku, Kyoto 6068501, Japan
[3] Natl Maritime Res Inst, Tokyo 1810004, Japan
关键词
ionization chamber; synchrotron radiation; SPring-8; photon intensity; monitor; photodiode; linear polarization; photoelectron;
D O I
10.1016/j.nima.2004.01.040
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
As an intensity monitor for high-energy synchrotron radiation, a parallel-plate free-air ionization chamber was developed. An EGS4 Monte-Carlo transport calculation considering linear polarization showed that the electron escape fraction was within 0.5% below 70 keV, 2.7-3.3% below 150 keV and 1.1% at 150 keV when the plate separation was 8.5 cm. Without polarization, the electron loss increased to 4-5% at 70-100 keV and 3% at 150 keV. Using the chamber, photon intensity was measured at SPring-8 and compared to that of another free-air ionization chamber with a 5-cm plate separation at 30 and 40 keV, which had been calibrated with a calorimeter, and to that of a Si-PIN photodiode between 50 and 150 keV. As expected by the Monte Carlo calculation considering linear polarization, agreement was obtained within 1.3% below 70 keV, 2.2% up to 100 keV and 1.0% at 150 keV. If the collection efficiency corresponding to the result is used at each energy level, the uncertainty is limited to about 3% for the photon intensity monitoring. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:324 / 331
页数:8
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