Transmission electron microscopy characterization of precipitate/matrix interfaces in doped Mn4Si7 thermoelectric crystal

被引：0
|
作者：
Orekhov, Andrey [1 ]
Suvorova, Elena [1 ]
机构：
[1] RAS, Shubnikov Inst Crystallog, Moscow, Russia
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2015年 / 71卷
关键词：
Structure of interfere; doped crystal; higher manganese silicide;
D O I：
10.1107/S2053273315098915
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS18-O5
引用
收藏
页码：S73 / S73
页数：1
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