Optical degradation mechanisms of mid-power white-light LEDs in LM-80-08 tests

被引：9

作者：

Huang, Jianlin ^{[1
]}

Golubovic, Dusan S. ^{[2
]}

Koh, Sau ^{[1
]}

Yang, Daoguo ^{[3
]}

Li, Xiupeng ^{[4
]}

Fan, Xuejun ^{[5
,7
]}

Zhang, G. Q. ^{[6
,8
]}

机构：

[1] Delft Univ Technol, Beijing Res Ctr, Beijing 100083, Peoples R China

[2] Lumileds Commercial Shanghai Co Ltd, Shanghai 200233, Peoples R China

[3] Guilin Univ Elect Technol, Guangxi 541004, Peoples R China

[4] Philips Lighting, Shanghai 200233, Peoples R China

[5] State Key Lab Solid State Lighting, Beijing 100083, Peoples R China

[6] Delft Univ Technol, NL-2628 CT Delft, Netherlands

[7] Lamar Univ, Beaumont, TX 77710 USA

[8] Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China

来源：

MICROELECTRONICS RELIABILITY | 2015年 / 55卷 / 12期

基金：

美国国家科学基金会;

关键词：

Decay; Degradation; LED; Light emitting diodes; Lumen; BISPHENOL-A POLYCARBONATE; GAN; RELIABILITY;

D O I：

10.1016/j.microrel.2015.09.008

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, the optical degradation mechanisms of mid-power white-light LEDs, were studied by using high temperature operation life tests, according to the IES standard LM-80-08. As a consequence, it is found that, (1) the degradation mechanisms are different for LED packages aged at different case temperatures; (2) the optical degradation is a result of combination of chip-related degradation mechanisms and package-related degradation mechanisms. In details, for LEDs aged at 55 degrees C, the optical degradation was induced by both the deterioration of blue chip and silver-coating lead frames, while for LEDs aged at 85 degrees C and 105 degrees C, only blue chip deterioration was considered as the main degradation mechanism. (C) 2015 Elsevier Ltd. All rights reserved.

引用

页码：2654 / 2662

页数：9

共 6 条

[1] Degradation Mechanism Decoupling of Mid-Power White-Light LEDs by SPD Simulation
Huang, Jianlin
Golubovic, Dusan S.
Koh, Sau
Yang, Daoguo
Li, Xiupeng
Fan, Xuejun
Zhang, Guoqi
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 63 (07) : 2807 - 2814
[2] Degradation modeling of mid-power white-light LEDs by using Wiener process
Huang, Jianlin
Golubovic, Dusan S.
Koh, Sau
Yang, Daoguo
Li, Xiupeng
Fan, Xuejun
Zhang, G. Q.
OPTICS EXPRESS, 2015, 23 (15): : A966 - A978
[3] Rapid Degradation of Mid-Power White-Light LEDs in Saturated Moisture Conditions
Huang, Jianlin
Golubovic, Dusan S.
Koh, Sau
Yang, Daoguo
Li, Xiupeng
Fan, Xuejun
Zhang, G. Q.
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2015, 15 (04) : 478 - 485
[4] Degradation Mechanisms of Mid-Power White-Light LEDs Under High-Temperature-Humidity Conditions
Huang, Jianlin
Golubovic, Dusan S.
Koh, Sau
Yang, Daoguo
Li, Xiupeng
Fan, Xuejun
Zhang, G. Q.
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2015, 15 (02) : 220 - 228
[5] Long-term degradation mechanisms of mid-power LEDs for lighting applications
Buffolo, M.
De Santi, C.
Meneghini, M.
Rigon, D.
Meneghesso, G.
Zanoni, E.
MICROELECTRONICS RELIABILITY, 2015, 55 (9-10) : 1754 - 1758
[6] Optical Degradation Mechanisms of Indium Gallium Nitride-Based White Light Emitting Diodes by High-Temperature Aging Tests
Lu, Yi-Jun
Guo, Zi-Quan
Shih, Tien-Mo
Gao, Yu-Lin
Huang, Wei-Lin
Lu, Hong-Li
Lin, Yue
Chen, Zhong
IEEE TRANSACTIONS ON RELIABILITY, 2016, 65 (01) : 256 - 262

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