Polyimide containing an acetal structure with a photoacid generator: a novel positive polyimide photoresist

被引:11
|
作者
Akimoto, S
Kato, D
Jikei, M
Kakimoto, M
机构
[1] Toppan Printing Co Ltd, Tech Res Inst, Mat Res Lab, Sugito, Saitama 3458508, Japan
[2] Tokyo Inst Technol, Dept Organ & Polymer Mat, Meguro Ku, Tokyo 1528552, Japan
关键词
D O I
10.1088/0954-0083/12/1/315
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
A main-chain degradable photosensitive polyimide containing an acetal structure which degrades by the action of acid coming from a photoacid generator has been developed. Polyimides 4 were prepared by the reaction of bis(4-aminophenoxy)methane 1 and various tetracarboxylic anhydrides 2, followed by thermal treatment. In the resulting polyimides 4, 4f film derived from 4,4'-hexafluoroisopropylidenebis(phthalic anhydride) (6FDA) and 1 showed good solubility in organic solvents and transparency to UV light. The acid-catalysed degradation reaction was confirmed by the model imide compound in the presence of p-toluenesulfonic acid. The system of the polyimide 4f containing 30 wt% of diphenyliodonium 9,10-dimethoxyanthracene-2-sulfonate (DIAS), which is a photoacid generator (PAG) showed a sensitivity of 150 mJ cm(-2) with 436 nm light, when it was post-exposure baked at 140 degrees C for 30 min, followed by development with 5% tetramethylammonium hydroxide solution at 45 degrees C.
引用
收藏
页码:185 / 195
页数:11
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