The LCPDI: A compact and robust phase-shifting point-diffraction interferometer based on dye-doped LC technology

被引:4
|
作者
Marshall, Kenneth L.
Adelsberger, Kathleen
Myhre, Graham
Griffin, DeVon W.
机构
[1] Univ Rochester, Laser Energet Lab, Rochester, NY 14623 USA
[2] NASA, Glenn Res Ctr, Micrograv Fluid Phys Branch, Brookpark, OH USA
关键词
interferometry; liquid crystal; phase-shifting; photoresist; point diffraction;
D O I
10.1080/15421400600654116
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Point-diffraction interferometers, by design, are much less sensitive to environmental disturbances than dual-path interferometers, but, until very recently, have not been capable of phase shifting. The liquid crystal point diffraction interferometer (LCPDI) utilizes a dye-doped, liquid crystal (LC), electro-optical device that functions as both the point-diffraction source and the phase-shifting element, yielding a phase-shifting diagnostic device that is significantly more compact and robust while also using fewer optical elements than conventional dual-path interferometers. These attributes make the LCPDI of special interest for diagnostic applications in the scientific, commercial, military, and industrial sectors, where vibration insensitivity, power requirements, size, weight, and cost are critical issues. Until very recently, LCPDI devices have used a plastic microsphere embedded in the LC fluid layer as the point-diffraction source. The process for fabricating microsphere-based LCPDI devices is low-yield, labor-intensive, very "hands-on, and great care and skill are required to produce devices with adequate interference fringe contrast for diagnostic measurements. With the goal in mind of evolving the LCPDI beyond the level of a laboratory prototype, we have developed "second-generation" LCPDI devices in which the reference diffracting elements are an integral part of the substrates by depositing a suitable optical material (vapor-deposited thin films or photoresist) directly on the substrate surface. These "structured substrates eliminate many of the assembly difficulties and performance limitations of previous LCPDI devices as well as open the possibility of mass-producing LCPDI devices at low cost by the same processes used to manufacture commercial LC displays.
引用
收藏
页码:23 / 45
页数:23
相关论文
共 46 条
  • [1] Polarization phase-shifting point-diffraction interferometer
    Neal, Robert M.
    Wyant, James C.
    APPLIED OPTICS, 2006, 45 (15) : 3463 - 3476
  • [2] Experimental comparison of a liquid-crystal point-diffraction interferometer (LCPDI) and a commercial phase-shifting interferometer and methods to improve LCPDI accuracy
    Guardalben, Mark J.
    Ning, Lutao
    Jain, Nieraj
    Battaglia, Devon J.
    Marshall, Kenneth L.
    Applied Optics, 2002, 41 (07): : 1353 - 1365
  • [3] Experimental comparison of a liquid-crystal point-diffraction interferometer (LCPDI) and a commercial phase-shifting interferometer and methods to improve LCPDI accuracy
    Guardalben, MJ
    Ning, L
    Jain, N
    Battaglia, DJ
    Marshall, KL
    APPLIED OPTICS, 2002, 41 (07) : 1353 - 1365
  • [4] Experiment research on fiber phase-shifting point-diffraction interferometer
    Nie Liang
    Chen Lingfeng
    Sha Dingguo
    Wu Shuo
    ISTM/2007: 7TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-7, CONFERENCE PROCEEDINGS, 2007, : 2894 - 2897
  • [5] Evaluation of phase-shifting approaches for a point-diffraction interferometer with the mutual coherence function
    Barchers, JD
    Rhoadarmer, TA
    APPLIED OPTICS, 2002, 41 (36) : 7499 - 7509
  • [6] Phase-shifting point diffraction interferometer
    Medecki, H
    Tejnil, E
    Goldberg, KA
    Bokor, J
    OPTICS LETTERS, 1996, 21 (19) : 1526 - 1528
  • [7] Phase-shifting point diffraction interferometer
    Medecki, H.
    Tejnil, E.
    Goldberg, K.A.
    Bokor, J.
    1996, Optical Soc of America, Washington, DC, United States (21)
  • [8] Phase-shifting point-diffraction interferometry at 193 nm
    Lee, SH
    Naulleau, P
    Goldberg, KA
    Piao, F
    Oldham, W
    Bokar, J
    APPLIED OPTICS, 2000, 39 (31) : 5768 - 5772
  • [9] Phase-shifting point-diffraction interferometry at 193 nm
    Lee, S.H. (shlee@lbl.gov), 2000, Optical Society of America (OSA) (39):
  • [10] The EUV phase-shifting point diffraction interferometer
    Naulleau, P
    Goldberg, KA
    Lee, SH
    Chang, C
    Attwood, D
    Bokor, J
    SYNCHROTRON RADIATION INSTRUMENTATION, 2000, 521 : 66 - 72