Single Event Transients in Logic Circuits-Load and Propagation Induced Pulse Broadening

被引：60
|
作者：
Wirth, Gilson [1 ]
Kastensmidt, Fernanda L. [2 ]
Ribeiro, Ivandro [3 ]
机构：
[1] Univ Fed Rio Grande do Sul, Dept Elect Engn, Porto Alegre, RS, Brazil
[2] Univ Fed Rio Grande do Sul, Inst Informat, Porto Alegre, RS, Brazil
[3] Univ Fed Rio Grande do Sul, Programa Posgrad Microeletron, Porto Alegre, RS, Brazil
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2008年 / 55卷 / 06期
关键词：
Digital single event transients; load-induced pulse broadening effect; propagation-induced pulse broadening effect; SET generation; SET propagation;
D O I：
10.1109/TNS.2008.2006265
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The generation and propagation of single event transients (SET) in logic gate chains is studied and modeled. Regarding SET generation, we investigate the dependence of the generated SET pulse width on the struck node capacitance. Rising node capacitance may lead to amplified pulse width, indicating that increasing load capacitance alone is not an option for radiation hardening. SET propagation in logic chains is also studied, and it is shown that significant broadening or attenuation of the propagated transient pulse width may be observed. It is shown that the chain design (propagation delay of high to low and low to high transitions) has a major impact on broadening or attenuation of the propagated transient pulse. For the first time a suitable model for SET broadening is provided.
引用
收藏
页码：2928 / 2935
页数：8
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