Double metal subwavelength slit arrays interference to measure the orbital angular momentum and the polarization of light

被引：41
|
作者：
Zhou, Hailong [1 ]
Yan, Siqi [1 ]
Dong, Jianji [1 ]
Zhang, Xinliang [1 ]
机构：
[1] Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan 430074, Peoples R China
来源：
OPTICS LETTERS | 2014年 / 39卷 / 11期
基金：
中国国家自然科学基金;
关键词：
TRANSFORMATION; DIFFRACTION; PHOTONS; STATES; MODES; BEAMS;
D O I：
10.1364/OL.39.003173
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
We put forward a double-slit interference device based on two metal subwavelength slit arrays to measure the orbital angular momentum (OAM) and the polarization of beams simultaneously. The subwavelength slit serves as a localized spatial polarizer, and each slit array can be regarded as a wide diffraction-slit. When an OAM beam is normally incident upon the two slit arrays, the interference fringes twist, and the displacement depends on the topological charge of OAM beams. We present a detailed theoretical analysis of this measurement model. This model does not need additional reference light and is a linear model. (C) 2014 Optical Society of America
引用
收藏
页码：3173 / 3176
页数：4
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