Outdoor exposure tests of silicon crystalline photovoltaic for reliability

被引：0
|
作者：
Kim, Hyun-A [1 ]
Choi, Lung-Lin [1 ]
Kim, Sang-Cheol [1 ]
机构：
[1] Korea Conform Labs, Seoul 153803, South Korea
来源：
2014 IEEE 40TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC) | 2014年
关键词：
Silicon crystalline photovoltaic; reliability; outdoor test; field experience; photovoltaic; degradation; failure modes; maximum yield power generation tracking system;
D O I：
暂无
中图分类号：
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号：
0807 ; 0820 ;
摘要：
The photovoltaic (PV) system is one of the renewable energies that attract the attention of researchers in the recent decades. The evaluation of the PV performance requires the measurement of the current as a function of irradiance, temperature, humidity, wind power and wind direction. This work presents a degradation factor of silicon crystalline photovoItaics based on maximum yield power generation tracking system in outdoor exposure. Outdoor exposure tests of silicon crystalline PV have been conducted in Seosan-si, Chungcheongnam-do, Republic of Korea.
引用
收藏
页码：3193 / 3196
页数：4
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