3D shape measurement in the presence of strong interreflections by epipolar imaging and regional fringe projection

被引：31
|
作者：
Zhao, Huijie [1 ]
Xu, Yang [1 ]
Jiang, Hongzhi [1 ]
Li, Xudong [1 ]
机构：
[1] Beihang Univ, Sch Instrumentat Sci & Optoelect Engn, Key Lab Precis Optomechatron Technol, Minist Educ, 37 Xueyuan Rd, Beijing 100191, Peoples R China
来源：
OPTICS EXPRESS | 2018年 / 26卷 / 06期
基金：
中国国家自然科学基金;
关键词：
PROFILOMETRY; SPECKLE;
D O I：
10.1364/OE.26.007117
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A 3D shape measurement method in the presence of strong interreflections is presented. Traditional optical 3D shape measurement methods such as fringe projection profilometry (FPP) cannot measure regions that contain strong interreflections, which result in 3D shape measurement failure. In the proposed method, epipolar imaging with speckle patterns is utilized to eliminate the effects of interreflections and obtain the initial 3D shape measurement result. Regional fringe projection based on the initial measurement result is further applied to achieve high-accuracy measurement. Experimental results show that the proposed method can measure the regions that contain strong interreflections at a high accuracy. (C) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码：7117 / 7131
页数：15
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